G05900 - SEMI G59 - Test Method for Measurement of Ionic Contamination on Leadframe Interleafing and the Contamination Transferred from the Interleafing to the Leadframes Revision:SEMI G59-94 (Reapproved 0302) - Superseded SEMI E40-0705 (technical revision)

SEMI E40-0705 (technical revision)

and reticle inspection equipment reticle load ports

This Test Method describes a procedure to measure particles on sheet materials

This Test Method can be applied to manufacturing

SEMI D24 — Specification for Glass Substrates Used to Manufacture Flat Panel Displays

G05900 - SEMI G59 - Test Method for Measurement of Ionic Contamination on Leadframe Interleafing and the Contamination Transferred from the Interleafing to the Leadframes Revision:SEMI G59-94 (Reapproved 0302) - Superseded SEMI E40-0705 (technical revision)This Test Method describes a procedure to determine the ionic contamination on leadframe interleafing and the contamination transferred from the interleafing to the leadframes using a water extraction method. This Test Method is sensitive to the following ionic species: Na+, NH4+, K+, Cl , NO3 , Br , SO42 , PO43 . Referenced SEMI StandardsNone.