Rudolph Technologies 301.0 TIRA Guide Adjustment Tool 300mm Wafer F30 Working img{max-width:100%} Mettler-Toledo Thornton W298-200 Conductivity/Resistivity

img{max-width:100%} Mettler-Toledo Thornton W298-200 Conductivity/Resistivity Sensor New Surplus

Inventory # 13684

Some of the connecter pins may be slightly askew (see photos)

Removed from a TEL Tokyo Electron P-8 Fully Automatic Wafer Prober System This TEL Tokyo Electron 3281-000043-19 Display Driver PCB Card is used working surplus

This ASM 02-330608D01 is new other surplus

Rudolph Technologies 301.0 TIRA Guide Adjustment Tool 300mm Wafer F30 Working img{max-width:100%} Mettler-Toledo Thornton W298-200 Conductivity/ResistivityRudolph Technologies 301. 0 TIRA Guide Adjustment Tool 300mm Wafer F30 Working Inventory # A 19637 Part No: 301. 0 Model No: TIRA Guide Removed from a Rudolph Technologies F30 300mm Wafer Mounter & Defect Inspection System This Rudolph Technologies 301. 0 TIRA Guide Adjustment Tool is used working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day Warranty