E17100 - SEMI E171 - Specification for Predictive Carrier Logistics (PCL) Revision:SEMI E171-0524 - Current SEMI MF657 — Test Method

SEMI MF657 — Test Method for Measuring Warp and Total Thickness Variation on Silicon Slices and Wafers by a Noncontact Scanning Method

and SEMI E137

This Standard may be used by vendors and/or buyers of glass substrates for FPD

Crystalline sapphire wafers (CSW) are used as substrates for manufacturing compound semiconductor devices

the 1/e lifetime (τe) and/or the primary mode lifetime (τ1)

E17100 - SEMI E171 - Specification for Predictive Carrier Logistics (PCL) Revision:SEMI E171-0524 - Current SEMI MF657 — Test MethodThe purpose of this Standard is to provide a communication scheme for exchanges of carrier logistics related information, especially predictive information, between equipment and the factory system in order to support seamless cascading of carriers for continuous processing of equipment in semiconductor fabrication systems or similar ones. The purpose of this Standard is to provide models which represent carrier logistics management status in