E18300 - SEMI E183 - Specification for Rich Interactive Test Database (RITdb) Revision:SEMI E183-0123 - Current 再利用またはリサイクルの可能性の特定

再利用またはリサイクルの可能性の特定

the requirements are presented as guides

org in November 2013

SEMI F16 — Specification for 316L Stainless Steel Tubing Which Is to Be Finished and Electropolished for High Purity Semiconductor Manufacturing Applications

1  Introduction

E18300 - SEMI E183 - Specification for Rich Interactive Test Database (RITdb) Revision:SEMI E183-0123 - Current 再利用またはリサイクルの可能性の特定This Specification describes a data and event sharing and streaming methodology for semiconductor test and related operations. The scheme fully supports legacy equipment and allows equipment vendors the flexibility to provide additional data items via extensions. Real time, historical, and widely distributed data are fully supported. Provenance of all data is supported via customizable metadata along with cryptographic hashing and signing.