D05900 - SEMI D59 - Terminology for 3D Display Revision:SEMI D59-0519 - Superseded SEMI E143-0306 (Reapproved 0512)

SEMI E143-0306 (Reapproved 0512)

It specifically clarifies the load in the test method and evaluation items in the evaluation method

Crystalline sapphire wafers (CSW) are used as substrates for manufacturing compound semiconductor devices

Appropriate information is summarized in § 5

SEMI E90 — Specification for Substrate Tracking

D05900 - SEMI D59 - Terminology for 3D Display Revision:SEMI D59-0519 - Superseded SEMI E143-0306 (Reapproved 0512)1 Purpose 1. 1 This Standard is written to provide better communication between parties in the supply chain, as well as between resale and consumers. 2 Scope 2. 1 This Standard starts with the basic and most necessary terms which are used in 3D display (especially for those different from 2D displays). Establishment of other related terminologies will follow. Referenced SEMI Standards (purchase separately) None. Revision History SEMI D59 0710