Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation Ingestion-build-135476 acceptance of the screening file

acceptance of the screening file alone is not deemed to have met the requirements of this standard

– Event reporting and logging

measurements being made on one of more points on the steeply rising part of the stress-strain curve

the following technical changes have been made:

Using BS EN 55016-1-3 you can specify the characteristics and calibration of the absorbing clamp

Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation Ingestion-build-135476 acceptance of the screening fileWhat is this standard about? The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military and aerospace related applications. It is a destructive test. The objectives of the test are as follows: a) to detect and measure the degradation of