Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test Ingestion-build-258901 Television service providers

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10 Screw threads

BS EN 2349-317 standard specifies a method for determining the service life of coil switching devices in relays and contactors

d) with operating valves

and interpreting the data generated by near field scan (NFS) measurement

Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test Ingestion-build-258901 Television service providers1 Scope This part of IEC 60749 provides a steady state temperature and humidity bias life test for the purpose of evaluating the reliability of non hermetic packaged solid state devices in humid environments. This test method is considered destructive.