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Semiconductor devices. Micro-electromechanical devices - Tensile testing method of thin film materials has-digital BS EN 485-1:2008 replaces BS

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BS EN 485-1:2008 replaces BS EN 485-1:1994 which has been withdrawn

It covers classification according to wear and appearance retention

This International Standard provides terms and definitions used in the production

Interface 9-1- Plug connector interface

ISO 13012‑2 applies to:

Semiconductor devices. Micro-electromechanical devices - Tensile testing method of thin film materials has-digital BS EN 485-1:2008 replaces BS

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