Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-264231 Developing and implementing a BCM

Developing and implementing a BCM response

ISO 965-2 and ISO 3506-1

BS 4857-2 is the second part of BS 4857 which deals with methods of acoustic testing and rating of terminal reheat units

including machines

TCP-UDP/IP based communication profile has been defined

Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-264231 Developing and implementing a BCM1 Scope This PART of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.